FAR / DFAR Case Update (22 Jul 2016)

Status updates from the ‘Open Cases Reports’ …

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NDIA’s 7th Trusted Microelectronics Workshop with Ms. Kristen Baldwin, Dr. Bill Chappell, Dr. Robert Latiff (Maj Gen, USAF, Ret.) added Dept of Commerce Discussion on China’s Semiconductor Investment

NEW … discussion on China’s investment in semiconductor capabilities by Department of Commerce’s Mr. Brad Botwin and Mr. J. Travis Mosier on Day 1 of the workshop ….  Continue reading

FAR / DFAR Case Update (15 Jul 2016)

Status updates from the ‘Open Cases Reports’ …

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Chinese man to serve U.S. prison term for military hacking

A Chinese businessman who pleaded guilty in March to conspiring to hack into the computer networks of Boeing (BA.N) and other major U.S. defense contractors was sentenced on Wednesday to nearly four years in prison, prosecutors said. …

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FAR / DFAR Case Update (8 Jul 2016)

Status updates from the ‘Open Cases Reports’ …

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Pentagon Weighs Strategy to Secure ‘Trusted’ Electronics Suppliers

“… The Pentagon has enacted stringent regulations in recent years to stave off the flow of fake electronics. … Despite these measures, the Pentagon appears to still have concerns about the safety of components and future access to a reliable supply of microelectronics for U.S. weapon systems. A major fear is the possibility of U.S. adversaries or industrial spies penetrating the supply chain. …

More at National Defense Magazine

NDIA’s 7th Trusted Microelectronics Workshop will feature Ms. Kristen Baldwin, Dr. Bill Chappell, and Dr. Robert Latiff (Maj Gen, USAF, Ret.)

NDIA is pleased to announce that our seventh Trusted Microelectronics Workshop has now been expanded to two days, with the second day focused on Technology Based Solutions for Trusted Microelectronics.

Ms. Kristen Baldwin, Acting Deputy Assistant Secretary of Defense for Systems Engineering, will keynote Day 1 of our workshop with a presentation on OSD’s current and future security framework to ensure our defense systems have access to trusted technology components.

Dr. Bill Chappell, Director, DARPA Microelectronics Technology Office will keynote Day 2 with an introduction to the work being done at DARPA to explore technology based Trust solutions.

Presentations by DARPA MTO program managers and IARPA’s Dr. Carl McCants will follow Dr. Chappell’s talk on Day 2.

Dr. Robert Latiff (Maj Gen, USAF, Ret) will provide observations from the Air Force Science Board study, “Optimizing the Air Force Acquisition Strategy of Secure and Reliable Electronic Components”.

More at NDIA

FAR / DFAR Case Update (5 Jul 2016)

Status updates from the ‘Open Cases Reports’ …

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FAR / DFAR Case Update (24 Jun 2016)

Status updates from the ‘Open Cases Reports’ …

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Rep. Cook Introduces Legislation To Combat Chinese Counterfeiting

WASHINGTON – Rep. Paul Cook (R-Apple Valley) and Rep. Gene Green (D-TX) today introduced HR 5579, the Secure E-waste Export and Recycling Act (SEERA). This national security bill stops the flow of e-waste to China and other countries that regularly counterfeit electronics. The bill will ensure that such waste does not become the source of counterfeit goods that may reenter military and civilian electronics in the United States.

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