Critique of ECN Webinar “The Fight Against Counterfeit Electronic Components”

Earlier today, ECN held an educational webinar on “The Fight Against Counterfeit Electronic Components – Evolving Regulations and Corresponding Impact”.

The panelist included ….

· Andrew Olney, Director of Reliability and Product Analysis Analog Devices, Inc.; Chair of the SIA Anti-Counterfeiting Task Force

· Daryl Hatano, Vice President of Government and External Affairs, ON Semiconductor

This webinar covered ongoing activity of the Semiconductor Industry Association (SIA) Anti-Counterfeiting Task Force (ACTF), an overview of the counterfeit avoidance and detection requirements expected as a result of Section 818 of the FY2012 NDAA, and a discussion of the counterfeit parts threat to electronics equipment reliability.

I found the discussion concerning the threat to electronics equipment reliability particularly interesting and timely given the ongoing debate over what minimum tests and inspections are necessary to detect counterfeits. The panelists discussed several potential failure mechanisms associated with different types of counterfeits including those induced by exposure to conditions parts are subjected to during counterfeiting operations. Consistent with recent reports from subject matter experts, the panelist have observed that counterfeiters continue to refine their craft creating an increasing challenge for the user community to improve and expand detection techniques necessary to reveal disguises and damage.

Many thanks to Andrew Olney and Daryl Hatano for this informative and effective webinar!


One thought on “Critique of ECN Webinar “The Fight Against Counterfeit Electronic Components”

  1. Anonymous says:

    It was a very good Webinar and I am going to watch it again as soon as it shows up on the ECNMag website.

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